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ecdsa_adaptor: fix too small buffer in tests

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Also add a specific test that fails adaptor sig deserialization because with the
correct size buffer that's not guaranteed anymore with the existing test.
This commit is contained in:
Jonas Nick 2021-06-14 20:57:40 +00:00
parent b053e853d4
commit 7226cf215a
1 changed files with 9 additions and 1 deletions
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10
src/modules/ecdsa_adaptor/tests_impl.h
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@ -1032,7 +1032,15 @@ void adaptor_tests(void) {
CHECK(secp256k1_ecdsa_adaptor_verify(ctx, adaptor_sig, &enckey, msg, &enckey) == 0); CHECK(secp256k1_ecdsa_adaptor_verify(ctx, adaptor_sig, &enckey, msg, &enckey) == 0);
CHECK(secp256k1_ecdsa_adaptor_verify(ctx, adaptor_sig, &pubkey, msg, &pubkey) == 0); CHECK(secp256k1_ecdsa_adaptor_verify(ctx, adaptor_sig, &pubkey, msg, &pubkey) == 0);
{ {
unsigned char adaptor_sig_tmp[65]; /* Test failed adaptor sig deserialization */
unsigned char adaptor_sig_tmp[162];
memset(&adaptor_sig_tmp, 0xFF, 162);
CHECK(secp256k1_ecdsa_adaptor_verify(ctx, adaptor_sig_tmp, &pubkey, msg, &enckey) == 0);
}
{
/* Test that any flipped bit in the adaptor signature will make
* verification fail */
unsigned char adaptor_sig_tmp[162];
memcpy(adaptor_sig_tmp, adaptor_sig, sizeof(adaptor_sig_tmp)); memcpy(adaptor_sig_tmp, adaptor_sig, sizeof(adaptor_sig_tmp));
rand_flip_bit(&adaptor_sig_tmp[1], sizeof(adaptor_sig_tmp) - 1); rand_flip_bit(&adaptor_sig_tmp[1], sizeof(adaptor_sig_tmp) - 1);
CHECK(secp256k1_ecdsa_adaptor_verify(ctx, adaptor_sig_tmp, &pubkey, msg, &enckey) == 0); CHECK(secp256k1_ecdsa_adaptor_verify(ctx, adaptor_sig_tmp, &pubkey, msg, &enckey) == 0);